Explorando arroz - aplicações de microscópio eletrônico de varredura (SEM)

CIQTEK SEM5000 é um microscópio eletrônico de varredura de emissão de campo com capacidade de imagem e análise de alta resolução, apoiado por funções abundantes, benefícios de design avançado de coluna óptica eletrônica, com tecnologia de túnel de feixe de elétrons de alta pressão (SuperTunnel), baixa aberração e não imersão lente objetiva, alcança imagens de baixa tensão e alta resolução, a amostra magnética também pode ser analisada. Com navegação óptica, funcionalidades automatizadas, interface de usuário de interação humano-computador cuidadosamente projetada e operação e processo de uso otimizados, não importa se você é um especialista ou não, você pode começar rapidamente e concluir o trabalho de análise e imagem de alta resolução.

CIQTEK SEM5000 é um microscópio eletrônico de varredura de emissão de campo com capacidade de imagem e análise de alta resolução, apoiado por funções abundantes, benefícios de design avançado de coluna óptica eletrônica, com tecnologia de túnel de feixe de elétrons de alta pressão (SuperTunnel), baixa aberração e não imersão lente objetiva, alcança imagens de baixa tensão e alta resolução, a amostra magnética também pode ser analisada. Com navegação óptica, funcionalidades automatizadas, interface de usuário de interação humano-computador cuidadosamente projetada e operação e processo de uso otimizados, não importa se você é um especialista ou não, você pode começar rapidamente e concluir o trabalho de análise e imagem de alta resolução.

Stable, Versatile, Flexible, and Efficient   The CIQTEK SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.9nm@1.0kV, and easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further. The microscope utilizes multi-detector technology, with an in-column electron detector (UD) capable of detecting SE and BSE signals while providing high-resolution performance. The chamber-mounted electron detector (LD) incorporates crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images with excellent quality. The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto stigmator, and automatic alignment, allowing for rapid capture of ultra-high resolution images.

Stable, Versatile, Flexible, and Efficient   The CIQTEK SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.9nm@1.0kV, and easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further. The microscope utilizes multi-detector technology, with an in-column electron detector (UD) capable of detecting SE and BSE signals while providing high-resolution performance. The chamber-mounted electron detector (LD) incorporates crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images with excellent quality. The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto stigmator, and automatic alignment, allowing for rapid capture of ultra-high resolution images.

Analytical Schottky Field Emission Scanning Electron Microscope (FESEM)   CIQTEK SEM4000Pro is an analytical FE-SEM model equipped with a high-brightness and long-life Schottky field emission electron gun. Its three-stage electromagnetic lens design offers significant advantages in analytical applications such as EDS / EDX, EBSD, WDS, and more. The model comes standard with a low-vacuum mode and high-performance low-vacuum secondary electron detector, as well as a retractable backscattered electron detector, which benefits the observation of poorly conductive or non-conductive specimens.  

High Resolution under Low Excitation   The CIQTEK SEM5000Pro is a high-resolution Schottky field emission scanning electron microscope (FE-SEM) specialized in high resolution even under low excitation voltage. Employing an advanced "Super-Tunnel" electron optics technology facilitates a crossover-free beam path and an electrostatic-electromagnetic compound lens design. These advancements reduce spatial charging effect, minimize lens aberrations, enhance imaging resolution at low voltage, and achieve a resolution of 1.2 nm at 1 kV, which allows for direct observation of non-conductive or semi-conductive samples, effectively reducing sample irradiation damage.

High-performance and Universal Tungsten Filament SEM Microscope   The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expendabilities.

Ultra High-Resolution Tungsten Filament Scanning Electron Microscope   The CIQTEK SEM3300 Scanning Electron Microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.

Ultra-high Resolution Field Emission Scanning Electron Microscopy (FESEM)   The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.

Microscópio eletrônico de transmissão de emissão de campo de 120kV (TEM) 1. Espaços de trabalho divididos: Os usuários operam o TEM em uma sala dividida com conforto, reduzindo a interferência ambiental no TEM. 2. Alta eficiência operacional: O software designado integra processos altamente automatizados, permitindo interação eficiente de TEM com monitoramento em tempo real. 3. Experiência Operacional Atualizada: Equipado com um canhão de elétrons de emissão de campo com um sistema altamente automatizado. 4. Alta capacidade de expansão: Existem interfaces suficientes reservadas para os usuários atualizarem para uma configuração superior, que atende a diversos requisitos de aplicação.

High-speed Fully Automated Field Emission Scanning Electron Microscope Workstation   CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution. The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. Its imaging speed is over five times faster than that of a conventional field emission scanning electron microscope (FESEM).

Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope   The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities.   The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.