What if you could simply tell your SEM what you need, then let it handle the repetitive work? CIQTEK has launched SEM Agent, an AI-assisted platform designed to connect SEM imaging, analysis, and reporting in one workflow. Users can describe a task by text or voice, and the system can call more than 40 tools to carry out steps from area selection and image acquisition to data analysis and report generation. The idea is simple: reduce the time spent adjusting settings, searching for areas of interest, moving data between software, and organizing reports, while keeping the researcher in control of the final scientific judgment. Figure 1. CIQTEK SEM Agent Unveiled at the 2026 Electron Microscopy Conference Why SEM Workflows Need More Than Better Hardware A powerful microscope does not automatically mean a more efficient workflow. In everyday SEM work, researchers may still spend a large amount of time adjusting parameters, locating samples, organizing images, moving results between different software tools, and preparing reports. Many successful methods also remain tied to individual experience. When a new sample or task appears, the workflow often has to be rebuilt or adjusted manually. SEM Agent is designed to connect the microscope, analysis tools, and workflow knowledge around the task the user actually wants to complete. One Request, One Connected SEM Workflow Instead of operating each step separately, users can describe the task they want to complete. For example, a user can ask SEM Agent to image a lithium iron phosphate sample from 2,000× to 100,000× magnification, organize the images, analyze the results, and prepare a sample report. The system can then check microscope status and imaging conditions, adjust brightness, focus and stigmation, switch between magnifications, collect images, evaluate image quality, analyze sample features, save the results, and organize them into a report. Figure 2. Automated Multi-Magnification Imaging of a Lithium Iron Phosphate Sample Large-area acquisition is another typical task. In one chip demonstration, SEM Agent collected 70 fields of view in a 7 × 10 grid at 1,000× magnification and stitched the images into a larger overview. Each local image remained traceable to its original position. This helps reduce repetitive stage movement and the time normally spent sorting and organizing images after acquisition. Figure 3. Large-Area Automated Acquisition and Image Stitching Image Analysis Built Around the Sample SEM Agent is not limited to image acquisition. Users can also describe what they want to measure or identify, and the system can organize the corresponding analysis workflow. Current applications include particle size analysis, diamond wire measurement, nickel layer inspection, and defect analysis. Depending on the task, the workflow can include segmentation, measurement, statistics, and visualization. The goal is to reduce repetitive manual tracing, counting, and result organi...

CIQTEK has officially launched its 200 kV field emission transmission electron microscope, TEM-F200, delivering 0.10 nm information resolution and featuring several key subsystems developed in-house. Unveiled on October 18 at the 2026 National Electron Microscopy Annual Conference in China, the TEM-F200 is designed for demanding work in materials science, semiconductor research, and nanoscale characterization. The launch also marks another step toward a more complete domestic TEM platform, from key hardware to imaging and analysis workflows. Built Around Resolution, Stability, and Practical Use For TEM users, resolution is only part of the story. Stability, ease of operation, detector performance, automation, and service all affect what the microscope can actually deliver day-to-day. The TEM-F200 combines a 200 kV field emission electron source with a self-developed high-voltage power supply and optical system. TEM-F200 Key Specifications 200 kV Field Emission Transmission Electron Microscope Acceleration Voltage 20 to 200 kV Information Resolution 0.10 nm Point Resolution 0.25 nm STEM Resolution 0.16 nm STEM Detector Modes HAADF, ADF, ABF Magnification 20× to 1,200,000× Super-EDS Optional dual 100 mm² windowless SDD detectors with symmetrical geometry, energy resolution ≤127 eV Optional Configurations EELS, 4D-STEM, 3D-ED, in situ sample holder A thermostatic water-cooled objective lens and four-axis sample stage help support stable imaging, while automated aperture control, position memory, and one-click adjustment are designed to reduce repetitive manual work. The main imaging camera is CIQTEK’s self-developed 16-megapixel fiber-coupled CMOS camera, built specifically for TEM use. The camera combines a 9 μm CMOS sensor, 4K × 4K imaging, and up to 24 fps at full resolution. Less Time at the Controls, More Time on the Sample The TEM-F200 also puts a strong focus on workflow. Fluorescent-screen images can be transferred directly to the PC display, while high-voltage control, electron-gun auto-start, vacuum operation, sample-position auto navigation, and STEM detector movement can all be integrated into the system workflow. For laboratories that need more flexibility, the platform can also be expanded with EDS, EELS, 4D-STEM, 3D electron diffraction, side cameras, cryogenic components, and in situ holders. From FinFET Devices to Advanced Alloys The new system has already been demonstrated on a range of demanding samples. For semiconductor FinFET devices, local nanoscale features and fine lattice structures were clearly resolved, with FFT analysis showing a spacing down to 1.045 Å. Semiconductor FinFET Cross-sectional imaging of semiconductor memory chips clearly revealed multilayer thin-film and dielectric structures. For 7075 aerospace aluminum alloy, TEM-BF and STEM-HAADF imaging resolved nanoscale precipitates, discontinuous grain-boundary phases, and precipitate-free zones. The system was also used to e...

CIQTEK officially unveiled its self-developed TEM-F200 200 kV Field Emission Transmission Electron Microscope at the 2026 National Annual Conference on Electron Microscopy in Nanjing, China. The TEM-F200 was the headline launch among five new electron microscopy products introduced during the event. The new lineup also includes the TEM-F120 120 kV Field Emission TEM, SEM5000Ultra Ultra-High-Resolution Field Emission SEM, a purpose-built fiber-coupled CMOS camera for TEM, and CIQTEK SEM Agent. Together, the launches expand CIQTEK's electron microscopy portfolio from complete microscope systems to imaging hardware and intelligent software. A New 200 kV TEM Developed In-House On October 18, CIQTEK Vice President Dr. Cao Feng introduced the TEM-F200 during a conference presentation focused on the development of CIQTEK's 200 kV transmission electron microscopy technology. The system reaches an information resolution of 0.10 nm. Key components, including the high-voltage power supply, electron gun, constant-power water-cooled objective lens, fully automated apertures, and fiber-coupled CMOS camera, were developed in-house. The TEM-F200 is now ready for volume production and delivery. The launch marks an important step in CIQTEK's expansion into higher-end transmission electron microscopy and strengthens its ability to develop complete electron microscopy systems around core technologies. Five New Products Across TEM, SEM, Imaging and AI Alongside the TEM-F200, CIQTEK introduced four additional products covering different parts of the electron microscopy workflow: TEM-F120, a 120 kV Field Emission Transmission Electron Microscope SEM5000Ultra, an Ultra-High-Resolution Field Emission Scanning Electron Microscope A purpose-built fiber-coupled CMOS camera for TEM CIQTEK SEM Agent, an intelligent software platform for electron microscopy These launches extend beyond individual instruments. They cover complete TEM and SEM systems, core imaging components, and AI-powered software, showing a broader approach to electron microscopy development.   From New Instruments to Smarter Microscopy Workflows During the 2026 National Annual Conference on Electron Microscopy, CIQTEK also hosted a series of product sessions covering its TEM portfolio, the new SEM5000Ultra and wider SEM lineup, as well as its AI electron microscopy roadmap and SEM Agent platform. The focus was not simply on adding more instruments. As microscopy workflows become more complex, users increasingly need a combination of high-resolution imaging, stable hardware, automation, and easier operation. By developing complete microscopes, core components, and intelligent software together, CIQTEK is building a more connected electron microscopy platform for materials science, semiconductor research, life science, and other advanced applications.   Expanding CIQTEK's Electron Microscopy Platform CIQTEK also worked with seven industry partners during the conference to showcase technologies and ap...