CIQTEK Global Tour: Showcasing Advanced SEM Solutions at SCANDEM 2026, Denmark

[Odense, Denmark] CIQTEK is proud to announce its participation in the 77th Annual Meeting of the Nordic Microscopy Society (SCANDEM 2026), held in Odense, Denmark, from June 9 to 12.

Visit Us at Booth II.5

As a hub for precision instrumentation, Odense provides the perfect stage for CIQTEK to achieve "Academic Resonance" with top-tier Nordic institutions. By deepening our roots in the scientific ecosystems of Denmark, Sweden, and Norway, we aim to address the most demanding characterization needs and empower regional research and industrial growth through our precision measurement tools.

Expert Talk: High-Speed SEM Innovation

A highlight of CIQTEK’s participation will be a technical presentation by our Solution Manager:

• Speaker: Dr. Miles Yao, Solution Manager at CIQTEK

• Topic: Unlocking the Power of Unique High-Speed Scanning Electron Microscopy Solution from CIQTEK

• Focus: Discover how CIQTEK’s unique high-speed SEM solutions enable large-scale, high-resolution imaging to accelerate research productivity.

Global Vision: Seamless Professional Support

CIQTEK is rapidly expanding its global service network. At SCANDEM 2026, our European team will provide direct expertise to the Nordic research community. We are committed to delivering responsive and professional support across borders—from installation to specialized application development—ensuring scientific excellence for our partners in Northern Europe.